Integration and Test Strategies for Complex Manufacturing Machines
de Jong, I. 2008. Integration and Test Strategies for Complex Manufacturing Machines: Integration and Testing Combined in a Single Planning and Optimization Framework. Saarbrücken, Germany: Verlag.
This source is considered a primary reference for the Business Activities Related to Product Systems Engineering articles.
This PhD thesis research project goal is to reduce the duration of the integration and test phase of large complex embedded systems. It uses a Wafer Scanner as an example. The work was performed at the Embedded Systems Institute in Eindhoven.
Please provide your comments and feedback on the SEBoK below. You will need to log in to DISQUS using an existing account (e.g. Yahoo, Google, Facebook, Twitter, etc.) or create a DISQUS account. Simply type your comment in the text field below and DISQUS will guide you through the login or registration steps. Feedback will be archived and used for future updates to the SEBoK. If you provided a comment that is no longer listed, that comment has been adjudicated. You can view adjudication for comments submitted prior to SEBoK v. 1.0 at SEBoK Review and Adjudication. Later comments are addressed and changes are summarized in the Letter from the Editor and Acknowledgements and Release History.
If you would like to provide edits on this article, recommend new content, or make comments on the SEBoK as a whole, please see the SEBoK Sandbox.blog comments powered by Disqus